Zenpire Corporation
Software and systems to automate analysis of semiconductor defects and testing of wafers. Include databases, SECS/GEM, remote administration of hardware, and e-diagnostics supporting most operating systems. Supports equipment from KLA-Tencor, Applied Materials, ADE, Inspex, Electroglas, TEL, TSK, Teradyne, Credence to name a few.

Ziemann & Urban GmbH - Special automation & vision systems
We offer turn-key automation with vision systems, semi to fully-automatic Diebonder and Diesorter, Inline Blistertape and Reel-2-Reel inspection.

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